JEOL SEM 7600

Overview

• Location: S6.5.34
• Institute: IBL
• Microscope Type: Electron microscope (SEM)

• Specialists: Joost, Bas

• Booking: Link

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• Capabilities

  • Inverted: No
  • Temperature Control: No
  • CO₂ Control: No
  • O₂ Control: No
  • Automated Stage: No

• Optics & Detection

  • Detectors: SEI, LEI, BSD, EDS

• Emission Filters

  • With EDS for elemental analysis

• Typical Use

  • Applications: Fixed, Super-resolution
  • Sample Types: N/A

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